The Technical Association of the French Paper Industry (Atip) held its first day of the year dedicated to AI for Reliability in Strasbourg on March 19. The day before, participants were offered a tour of the Blue Paper mill, which has a production capacity of 440,000 tpy of corrugated case material (CCM). Ten paper mills were represented by one or more participants (Palm Descartes, Sterimed, GPC, Blue Paper, Norske Skog Golbey, Ahlstrom La Gère, Sylvamo, Sotipapier, Kimberly Clark and Papeterie de Vizille).
The key idea emerging from this day is that in the space of just a few years, the use of data and AI have established themselves as essential drivers of innovation and action for the paper industry, with suppliers offering a multitude of solutions and approaches. It is now up to each paper mill to harness these advances by setting clear objectives and a well-defined methodology.
During the day, nine companies presented their approach to this topic as well as their offerings dedicated to paper manufacturers. Acoem described the benefits achieved by paper machine monitoring. SAMP and Perspectives 3Ds explained the benefits of 3D scanning and AI for mapping and improving the reliability of technical asset management. Leroux & Lotz presented its MetisIA solution for the intelligent control of thermal power plants. Another speaker was ABB, who explained how AI applied to industry is truly positioning itself as the co-pilot of daily activities. For its part, Optimistik detailed its approach to improving the reliability of industrial equipment and processes, while Valmet presented its solutions for a more optimized and autonomous paper mill. Dalkia Analytics also detailed its approach with concrete examples. Finally, a new defect detection system without reel marking (using AI) was presented by Papertech (IBS) and Voith Paper gave an update on the installation of its OnCare.Health AI system on PM9 in the Saica mill in Zaragoza (Spain). Full report in a forthcoming issue of La Papeterie Magazine.
VALÉRIE LECHIFFRE
Photo: Valérie Lechiffre
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